Adhesion Measurement of Films and Coatings, Volume 2

Contents:

Preface

Interface adhesion: Measurement and analysis
A.G. Evans

Relative adhesion measurement for thin film microelectronicstructures. Part II.
L.P. Buchwalter

Testing the adhesion of hard coatings including the non-destructivetechnique of surface acoustic waves
H. Ollendorf, T. Schülke and D. Schneider

Scratch adhesion testing of coated surfaces --- Challenges and newdirections
J. Meneve, H. Ronkainen, P. Andersson, K. Vercammen, D. Camino, D.G.Teer, J. von Stebut, M.G. Gee, N.M. Jennett, J. Banks, B. Bellaton,E. Matthaei-Schulz and H. Vetters

Can the scratch adhesion test ever be quantitative?
S.J. Bull

Characterisation of thin film adhesion with the Nano-Scratch Tester(NST)
J.D. Holbery and R. Consiglio

Scratch adhesion testing of nanophase diamond coatings on industrialsubstrates
F. Davanloo, C.B. Collins and K.J. Koivusaari

Scratch test failure modes and performance of organic coatings formarine applications
S.J. Bull, K. Horvathova, I.P. Gilbert, D. Mitchell, R.I. Davidsonand J.R. White

An energetic approach for the evaluation of adhesion of sputterdeposited TiC films on glass by the scratch test
A. Kinbara, A. Sato, E. Kusano and N. Kikuchi

On the evaluation of coating-substrate adhesion by indentationexperiments
B. Rother

Measurement of interfacial fracture energy in microelectronicmultifilm applications
J.C. Hay, E.G. Liniger and X.H. Liu

Assessment of adhesion reliability for plastic flip-chippackaging
X. Dai, M.V. Brillhart and P.S. Ho

Adhesion and abrasion of sputter-deposited ceramic thin films onglass
S. Suzuki

Improvement and testing of diamond film adhesion
X.C. He, H.S. Shen, Z.M. Zhang, X.J. Hu and X.Q. Yang

Effect of primer curing conditions on basecoat-primer adhesion --- ALIDS study
J.S. Meth

Evaluation of a pulsed laser technique for the estimation of theadhesion strength of oxide coatings onto metallic substrates
G. Rosa, P. Psyllaki and R. Oltra

The blade adhesion test applied to polyimide films onto siliconsubstrate
S. Khasawinah and C.G. Smith

Mechanics of the JKR (Johnson--Kendall--Roberts) adhesion test
C.Y. Hui, J.M. Baney and Y.Y. Lin

Revisiting bimaterial curvature measurements for CTE ofadhesives
D.A. Dillard and J.-H. Yu

Raman spectroscopic determination of residual stresses in diamondfilms
Q.H. Fan, J. Grácio and E. Pereira

2001; viii+354 pages
ISBN 90-6764-337-8
Price (all prices are subject to change without notice): EUR 121/US$ 173